Software for Test, Measurement and Control
Applications, System Design, Network, Data Management
Semiconductor Measurement
Semiconductor Measurement For semiconductor engineers making wafer-level measurements in R&D and production environments, FemtoTek delivers software tools for fast implementation of PC based measurement solutions. With our tools, PCs programmed in LabVIEW, .NET or LabWindows/CVI can be used for complex, yet cost effective, measurements. Our software tools include: These tools are useful both for wafer-level electrical measurements, and optical measurements.

Examples of measurement applications that are best solved with PC-based solutions include:

FemtoTek has supplied software to most large semiconductor ATE vendors and a large number of device manufacturers.

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