Wafer Map Software displays the results of semiconductor wafer measurements in real time. The wafer map gives quick, easy feedback to the test operator. The wafer map display is written in LabVIEW using programming features for fast screen updates. The wafer map is designed as a sub-VI to be called from a main LabVIEW program. The main program will control measurements and wafer prober movements. (View Product Description)

Probe Plan Editor provides a way to create a sequence of x-y locations that can be fed into a LabVIEW based wafer test program. (View Product Description)

Companion products include (Prober Drivers)

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