LabVIEW Characterization Toolkit contains characterization tools designed to assist design and test engineers in design evaluation and yield improvement of ICs and electronic devices. The tools build on the low-cost flexible environment provided by National Instrument's LabVIEW. (View Product Description,)

Companion products include Wafer Map and Probeplan Editor (Utilities)

LabVIEW Shmoo Plot is used to characterize and visualize the operational area of a device. It is therefore an important tool in checking for unexpected weaknesses in device operation.

FemtoTek's LabVIEW Shmoo Plot offers a full set of features:

• Configurable x and y axis parameters
• Configurable x, y tracking parameters with formulas
• Choose contour or pass/fail, configure colors
• Operate interactively or as part of a test flow
• Dynamic VI calling interface to DUT test VI
• Menu selection of test parameters from test VI
• Save and recall configuration files
• Save results as report or image file

LabVIEW Margin Analysis is used to characterize the operating margins for all parameters of a device. The margin analysis is especially effective if the device has many parameters. For example the timing and level margins of all control and data pins for an IC can be examined.

FemtoTek's LabVIEW Margin Analysis offers a full set of features:

• Select parameters, select nominal value and margin limits
• Configurable margin search method
• Operate interactively or as part of a test flow
• Dynamic VI calling interface to DUT test VI
• Menu selection of test parameters from test VI
• Save and recall configuration files
• Save results as a report

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