For semiconductor engineers making wafer-level measurements in R&D and production environments, FemtoTek delivers software tools for fast implementation of PC based measurement solutions. With our tools, PCs programmed in LabVIEW or .NET can be used for complex, yet cost effective, measurements. Our software tools include:

• Prober Drivers (LabVIEW & .NET)
• Wafer Map Software (LabVIEW)
• Probe Plane Editor (LabVIEW)
• Shmoo & Margin Toolkits (LabVIEW)

These tools are useful both for wafer-level electrical measurements, and optical measurements.

Examples of measurement applications that are best solved with PC-based solutions include:

• SOC mixed signal meaurements
• LED and laser device measurements
• Wafer parametric measurements
• MEMs measurements
• ADC converter measurements
• Hall effect devices
• Optical thickness measurements

FemtoTek has supplied software to most large semiconductor ATE vendors and a large number of device manufacturers.