Software for Test, Measurement and Control
Applications, System Design, Network, Data Management
Semiconductor Measurement
For semiconductor engineers making wafer-level measurements in R&D and
production environments, FemtoTek delivers software tools for fast
implementation of PC based measurement solutions. With our tools, PCs programmed
in LabVIEW, .NET or LabWindows/CVI can be used for complex, yet cost effective,
measurements. Our software tools include:
- Prober Drivers (LabVIEW, .NET, and LabWindows/CVI)
- Wafer Map Software (LabVIEW & .NET)
- Probe Plan Editor (LabVIEW & .NET)
- Measurement Toolkits (LabVIEW)
Examples of measurement applications that are best solved with PC-based solutions include:
- SOC mixed signal measurements
- LED and laser device measurements
- Wafer parametric measurements
- MEMs measurements
- ADC converter measurements
- Hall effect devices
- Optical thickness measurements
FemtoTek has supplied software to most large semiconductor ATE vendors and a large number of device manufacturers.
© 2020 FemtoTek, Inc.